Absolute measurement of normalized thickness, t/λi, from off-axis electron holography. McCartney, M. & Gajdardziska-Josifovska, M. Ultramicroscopy, 53(3):283–289, March, 1994. ![Absolute measurement of normalized thickness, t/λi, from off-axis electron holography [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{mccartney_absolute_1994,
title = {Absolute measurement of normalized thickness, t/λi, from off-axis electron holography},
volume = {53},
issn = {03043991},
url = {http://linkinghub.elsevier.com/retrieve/pii/030439919490040X},
doi = {10.1016/0304-3991(94)90040-X},
language = {en},
number = {3},
urldate = {2015-09-07},
journal = {Ultramicroscopy},
author = {McCartney, M.R. and Gajdardziska-Josifovska, M.},
month = mar,
year = {1994},
pages = {283--289},
}
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