Accelerated reliability test method for optics in LED luminaire applications. Mehr, M. Y.; van Driel, W. D.; and Zhang, G. Q. In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on, pages 1--4, 2015. IEEE.
Paper bibtex @inproceedings{mehr_accelerated_2015,
title = {Accelerated reliability test method for optics in {LED} luminaire applications},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7103127},
urldate = {2016-10-20TZ},
booktitle = {Thermal, {Mechanical} and {Multi}-{Physics} {Simulation} and {Experiments} in {Microelectronics} and {Microsystems} ({EuroSimE}), 2015 16th {International} {Conference} on},
publisher = {IEEE},
author = {Mehr, M. Yazdan and van Driel, W. D. and Zhang, G. Q.},
year = {2015},
pages = {1--4}
}