Accelerated reliability test method for optics in LED luminaire applications. Mehr, M. Y.; van Driel, W. D.; and Zhang, G. Q. In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on, pages 1--4, 2015. IEEE.
Accelerated reliability test method for optics in LED luminaire applications [link]Paper  bibtex   
@inproceedings{mehr_accelerated_2015,
	title = {Accelerated reliability test method for optics in {LED} luminaire applications},
	url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7103127},
	urldate = {2016-10-20TZ},
	booktitle = {Thermal, {Mechanical} and {Multi}-{Physics} {Simulation} and {Experiments} in {Microelectronics} and {Microsystems} ({EuroSimE}), 2015 16th {International} {Conference} on},
	publisher = {IEEE},
	author = {Mehr, M. Yazdan and van Driel, W. D. and Zhang, G. Q.},
	year = {2015},
	pages = {1--4}
}
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