{"_id":"oevk59AppTxeSmBZW","bibbaseid":"meinshausen-frmont-weidezaage-plano-electroandthermomigrationinducedcu3snandcu6sn5formationinsnag30cu05bumps-2015","downloads":0,"creationDate":"2015-05-07T12:05:07.487Z","title":"Electro- and thermomigration induced Cu3Sn and Cu6Sn5 formation in SnAg3.0Cu0.5 bumps.","author_short":["Meinshausen, L.","Frémont, H.","Weide-Zaage, K.","Plano, B."],"year":2015,"bibtype":"article","biburl":"http://www.bibsonomy.org/bib/author/bernard?items=1000","bibdata":{"added-at":"2015-03-27T00:00:00.000+0100","author":["Meinshausen, Lutz","Frémont, Hélène","Weide-Zaage, Kirsten","Plano, Bernard"],"author_short":["Meinshausen, L.","Frémont, H.","Weide-Zaage, K.","Plano, B."],"bibtex":"@article{ journals/mr/MeinshausenFWP15,\n added-at = {2015-03-27T00:00:00.000+0100},\n author = {Meinshausen, Lutz and Frémont, Hélène and Weide-Zaage, Kirsten and Plano, Bernard},\n biburl = {http://www.bibsonomy.org/bibtex/21d34a5ed1618ba3db39efe3ced1df832/dblp},\n ee = {http://dx.doi.org/10.1016/j.microrel.2014.09.030},\n interhash = {48e9e7d892e8919ff9fe52269ca725a6},\n intrahash = {1d34a5ed1618ba3db39efe3ced1df832},\n journal = {Microelectronics Reliability},\n keywords = {dblp},\n number = {1},\n pages = {192-200},\n title = {Electro- and thermomigration induced Cu3Sn and Cu6Sn5 formation in SnAg3.0Cu0.5 bumps.},\n url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#MeinshausenFWP15},\n volume = {55},\n year = {2015}\n}","bibtype":"article","biburl":"http://www.bibsonomy.org/bibtex/21d34a5ed1618ba3db39efe3ced1df832/dblp","ee":"http://dx.doi.org/10.1016/j.microrel.2014.09.030","id":"journals/mr/MeinshausenFWP15","interhash":"48e9e7d892e8919ff9fe52269ca725a6","intrahash":"1d34a5ed1618ba3db39efe3ced1df832","journal":"Microelectronics Reliability","key":"journals/mr/MeinshausenFWP15","keywords":"dblp","number":"1","pages":"192-200","title":"Electro- and thermomigration induced Cu3Sn and Cu6Sn5 formation in SnAg3.0Cu0.5 bumps.","type":"article","url":"http://dblp.uni-trier.de/db/journals/mr/mr55.html#MeinshausenFWP15","volume":"55","year":"2015","bibbaseid":"meinshausen-frmont-weidezaage-plano-electroandthermomigrationinducedcu3snandcu6sn5formationinsnag30cu05bumps-2015","role":"author","urls":{"Link":"http://dx.doi.org/10.1016/j.microrel.2014.09.030","Paper":"http://dblp.uni-trier.de/db/journals/mr/mr55.html#MeinshausenFWP15"},"keyword":["dblp"],"downloads":0},"search_terms":["electro","thermomigration","induced","cu3sn","cu6sn5","formation","snag3","0cu0","bumps","meinshausen","frémont","weide-zaage","plano"],"keywords":["dblp"],"authorIDs":[],"dataSources":["wvAhRjakvxMweG8ZA"]}