Learning from Corrupted Binary Labels via Class-Probability Estimation.

Learning from Corrupted Binary Labels via Class-Probability Estimation. Menon, A. K.; van Rooyen, B.; Ong, C. S.; and Williamson, B. In Bach, F. R. and Blei, D. M., editors, ICML, volume 37, of JMLR Workshop and Conference Proceedings, pages 125-134, 2015. JMLR.org.

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Paper bibtex

@inproceedings{conf/icml/MenonROW15,
  author = {Menon, Aditya Krishna and van Rooyen, Brendan and Ong, Cheng Soon and Williamson, Bob},
  booktitle = {ICML},
  crossref = {conf/icml/2015},
  editor = {Bach, Francis R. and Blei, David M.},
  ee = {http://jmlr.org/proceedings/papers/v37/menon15.html},
  interhash = {7d5285984ddf32e5208abadf71fd7982},
  intrahash = {b25ed52586d29175d17439fcedeb95b6},
  pages = {125-134},
  publisher = {JMLR.org},
  series = {JMLR Workshop and Conference Proceedings},
  title = {Learning from Corrupted Binary Labels via Class-Probability Estimation.},
  url = {http://dblp.uni-trier.de/db/conf/icml/icml2015.html#MenonROW15},
  volume = 37,
  year = 2015
}

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