Learning from Corrupted Binary Labels via Class-Probability Estimation. Menon, A. K.; van Rooyen, B.; Ong, C. S.; and Williamson, B. In Bach, F. R. and Blei, D. M., editors, ICML, volume 37, of JMLR Workshop and Conference Proceedings, pages 125-134, 2015. JMLR.org.
Link
Paper bibtex @inproceedings{conf/icml/MenonROW15,
author = {Menon, Aditya Krishna and van Rooyen, Brendan and Ong, Cheng Soon and Williamson, Bob},
booktitle = {ICML},
crossref = {conf/icml/2015},
editor = {Bach, Francis R. and Blei, David M.},
ee = {http://jmlr.org/proceedings/papers/v37/menon15.html},
interhash = {7d5285984ddf32e5208abadf71fd7982},
intrahash = {b25ed52586d29175d17439fcedeb95b6},
pages = {125-134},
publisher = {JMLR.org},
series = {JMLR Workshop and Conference Proceedings},
title = {Learning from Corrupted Binary Labels via Class-Probability Estimation.},
url = {http://dblp.uni-trier.de/db/conf/icml/icml2015.html#MenonROW15},
volume = 37,
year = 2015
}