A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. Merac, Du, C. R., Jutier, P., Laurent, J., & Courtois, B. Pattern Recognition Letters, 1(5-6):347-352, 1983.
A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. [link]Link  A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. [link]Paper  bibtex   
@article{ journals/prl/MeracJLC83,
  added-at = {2014-11-24T00:00:00.000+0100},
  author = {Merac, C. Rubat Du and Jutier, P. and Laurent, J. and Courtois, Bernard},
  biburl = {http://www.bibsonomy.org/bibtex/231f0d8c643205e8eddd0b67769ddfb50/dblp},
  ee = {http://dx.doi.org/10.1016/0167-8655(83)90074-0},
  interhash = {fc195e3df3f299670f2b314619a2af57},
  intrahash = {31f0d8c643205e8eddd0b67769ddfb50},
  journal = {Pattern Recognition Letters},
  keywords = {dblp},
  number = {5-6},
  pages = {347-352},
  title = {A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing.},
  url = {http://dblp.uni-trier.de/db/journals/prl/prl1.html#MeracJLC83},
  volume = {1},
  year = {1983}
}

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