Characterization of interfaces in electrodeposited Cu-Co multilayers by Fresnel fringe analysis. Merkourakis, S., Hytch, M. J., Leprince-Wang, Y., & Walls, M. G. In ICEM-15: 15 th International Congress on Electron Microscopy, pages 341–342, 2002.
bibtex   
@inproceedings{merkourakis_characterization_2002,
	title = {Characterization of interfaces in electrodeposited {Cu}-{Co} multilayers by {Fresnel} fringe analysis},
	booktitle = {{ICEM}-15: 15 th {International} {Congress} on {Electron} {Microscopy}},
	author = {Merkourakis, S. and Hytch, M. J. and Leprince-Wang, Y. and Walls, M. G.},
	year = {2002},
	pages = {341--342},
}

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