A software tool for aging analysis of the CMOS inverter based on hot carrier degradation modeling. Messaris, I., Goudos, S., Nikolaidis, S., & Dimitriadis, C. In 2016 5th International Conference on Modern Circuits and Systems Technologies, MOCAST 2016, 2016.
abstract   bibtex   
© 2016 IEEE. It has been made clear that the presence of hot carriers triggers a series of physical processes that affects the FD-SOI and FinFET device characteristics under normal circuit operation. These effects cumulatively build up over prolonged periods, causing the circuit to age with time, resulting in performance degradations that may eventually lead to circuit failure. In this paper we tackle with the HC effects using a software tool that is able to quantify the HC induced degradation of the devices in a design, and furthermore predict the lifetime of the corresponding circuit. We present the Graphical User Interface (GUI) and we give examples of tool operation.
@inproceedings{
 title = {A software tool for aging analysis of the CMOS inverter based on hot carrier degradation modeling},
 type = {inproceedings},
 year = {2016},
 identifiers = {[object Object]},
 keywords = {Degradation model,MATLAB GUI,hot-carrier effect,n-FinFETs},
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 abstract = {© 2016 IEEE. It has been made clear that the presence of hot carriers triggers a series of physical processes that affects the FD-SOI and FinFET device characteristics under normal circuit operation. These effects cumulatively build up over prolonged periods, causing the circuit to age with time, resulting in performance degradations that may eventually lead to circuit failure. In this paper we tackle with the HC effects using a software tool that is able to quantify the HC induced degradation of the devices in a design, and furthermore predict the lifetime of the corresponding circuit. We present the Graphical User Interface (GUI) and we give examples of tool operation.},
 bibtype = {inproceedings},
 author = {Messaris, I. and Goudos, S.K. and Nikolaidis, S. and Dimitriadis, C.A.},
 booktitle = {2016 5th International Conference on Modern Circuits and Systems Technologies, MOCAST 2016}
}
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