Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations. Meuschke, N., Stange, V., Schubotz, M., Kramer, M., & Gipp, B. In 2019 ACM/IEEE Joint Conference on Digital Libraries (JCDL), pages 120–129, Champaign, IL, USA, June, 2019. IEEE. ![Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex 4 downloads @inproceedings{meuschke_improving_2019,
address = {Champaign, IL, USA},
title = {Improving {Academic} {Plagiarism} {Detection} for {STEM} {Documents} by {Analyzing} {Mathematical} {Content} and {Citations}},
isbn = {978-1-72811-547-4},
url = {https://ieeexplore.ieee.org/document/8791126/},
doi = {10/ggv8jd},
urldate = {2021-07-02},
booktitle = {2019 {ACM}/{IEEE} {Joint} {Conference} on {Digital} {Libraries} ({JCDL})},
publisher = {IEEE},
author = {Meuschke, Norman and Stange, Vincent and Schubotz, Moritz and Kramer, Michael and Gipp, Bela},
month = jun,
year = {2019},
keywords = {plagiarism detection},
pages = {120--129},
}
Downloads: 4
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