@article{
 title = {Characterization of electro-optic shielding effect in bulk CdTe:In crystals},
 type = {article},
 year = {2000},
 pages = {913-917},
 volume = {214},
 websites = {http://www.scopus.com/inward/record.url?eid=2-s2.0-0033701519&partnerID=tZOtx3y1},
 month = {6},
 publisher = {Elsevier Science B.V.},
 id = {4e01594f-18e1-3758-b3dd-5c1b9adcde60},
 created = {2016-04-12T13:14:33.000Z},
 accessed = {2016-04-12},
 file_attached = {false},
 profile_id = {d636df8b-dbd7-349c-8172-9f253b58c3e8},
 group_id = {1e8503e9-5fe7-398e-b5b0-831268375e5f},
 last_modified = {2017-03-14T11:27:23.071Z},
 read = {false},
 starred = {false},
 authored = {false},
 confirmed = {true},
 hidden = {false},
 citation_key = {Milani2000},
 private_publication = {false},
 abstract = {We have characterized the role of electro-optic field shielding effect in bulk CdTe:In rods at 1550 nm. Different temperatures, modulating frequencies and probe beam power have been tested. Experimental results agree with a dielectric relaxation explanation, when taking into account the high injection regime and the contribution of collection of photo-generated free excess carriers at the contacts. The lowering in electro-optic yield can be minimized by a suitable reduction in operating temperature and sample dimensions, having defined the optical power of the signal to be processed.},
 bibtype = {article},
 author = {Milani, A. and Bocchi, E. and Zappettini, A. and Pietralunga, S. M. and Martinelli, M.},
 doi = {10.1016/S0022-0248(00)00255-4},
 journal = {Journal of Crystal Growth}
}

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