Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Miller, M. J, Cabral, M. J, Dickey, E. C, LeBeau, J. M, & Reich, B. J Technometrics: a journal of statistics for the physical, chemical, and engineering sciences, 64:103–113, Taylor & Francis, 2 January, 2022.
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@ARTICLE{Miller2022-qm,
  title     = "{Accounting for Location Measurement Error in Imaging Data With
               Application to Atomic Resolution Images of Crystalline Materials}",
  author    = "Miller, Matthew J and Cabral, Matthew J and Dickey, Elizabeth C
               and LeBeau, James M and Reich, Brian J",
  journal   = "Technometrics: a journal of statistics for the physical,
               chemical, and engineering sciences",
  publisher = "Taylor \& Francis",
  volume    =  64,
  pages     = "103--113",
  month     =  "2~" # jan,
  year      =  2022,
  keywords  = "LeBeau Group",
  doi       = "10.1080/00401706.2021.1905070"
}

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