Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Miller, M. J, Cabral, M. J, Dickey, E. C, LeBeau, J. M, & Reich, B. J Technometrics: a journal of statistics for the physical, chemical, and engineering sciences, 64:103–113, Taylor & Francis, 2 January, 2022. doi bibtex 9 downloads @ARTICLE{Miller2022-qm,
title = "{Accounting for Location Measurement Error in Imaging Data With
Application to Atomic Resolution Images of Crystalline Materials}",
author = "Miller, Matthew J and Cabral, Matthew J and Dickey, Elizabeth C
and LeBeau, James M and Reich, Brian J",
journal = "Technometrics: a journal of statistics for the physical,
chemical, and engineering sciences",
publisher = "Taylor \& Francis",
volume = 64,
pages = "103--113",
month = "2~" # jan,
year = 2022,
keywords = "LeBeau Group",
doi = "10.1080/00401706.2021.1905070"
}
Downloads: 9
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