Fault modeling in controllable polarity silicon nanowire circuits. Mohammadi, H. G.; Gaillardon, P.; and Micheli, G. D. In Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, pages 453–458, 2015.
Fault modeling in controllable polarity silicon nanowire circuits [link]Paper  bibtex   
@inproceedings{DBLP:conf/date/MohammadiGM15,
  author    = {Hassan Ghasemzadeh Mohammadi and
               Pierre{-}Emmanuel Gaillardon and
               Giovanni De Micheli},
  title     = {Fault modeling in controllable polarity silicon nanowire circuits},
  booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe Conference
               {\&} Exhibition, {DATE} 2015, Grenoble, France, March 9-13, 2015},
  pages     = {453--458},
  year      = {2015},
  crossref  = {DBLP:conf/date/2015},
  url       = {http://dl.acm.org/citation.cfm?id=2755856},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/MohammadiGM15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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