Fault modeling in controllable polarity silicon nanowire circuits. Mohammadi, H. G., Gaillardon, P., & Micheli, G. D. In Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, pages 453–458, 2015. Paper bibtex @inproceedings{DBLP:conf/date/MohammadiGM15,
author = {Hassan Ghasemzadeh Mohammadi and
Pierre{-}Emmanuel Gaillardon and
Giovanni De Micheli},
title = {Fault modeling in controllable polarity silicon nanowire circuits},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe Conference
{\&} Exhibition, {DATE} 2015, Grenoble, France, March 9-13, 2015},
pages = {453--458},
year = {2015},
crossref = {DBLP:conf/date/2015},
url = {http://dl.acm.org/citation.cfm?id=2755856},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/bib/conf/date/MohammadiGM15},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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