A new inlet for simultaneous gas and particle phase measurements coupled to a chemical ionization high-resolution time-of-flight mass spectrometer. Mohr, C., Lee, B., H., Covert, D., S., Worsnop, D., R., & Thornton, J., A.
A new inlet for simultaneous gas and particle phase measurements coupled to a chemical ionization high-resolution time-of-flight mass spectrometer [pdf]Paper  bibtex   

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