Reconstruction of randomly and partially sampled STEM spectrum-images. Monier, E., Oberlin, T., Brun, N., Tencé, M., & Dobigeon, N. In Microscopy & MicroAnalysis (MM), volume 23, pages 170–171, Saint Louis, USA, Aug., 2017.
bibtex   
@Inproceedings{Monier_MM_2017,
  author       = {E. Monier and Th. Oberlin and N. Brun and M. Tenc\'e and N. Dobigeon},
  title        = {Reconstruction of randomly and partially sampled {STEM} spectrum-images},
  booktitle    = {Microscopy & MicroAnalysis (MM)},
  address      = {Saint Louis, USA},
  volume       = {23},
  issue        = {S1},
  month        = {Aug.},
  year         = {2017},
  pages        = {170--171},
  type		   = {International conferences},  
}

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