Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling – Complementary results. Monier, E.; Oberlin, T.; Brun, N.; Tencé, M.; Li, X.; and Dobigeon, N. Technical Report University of Toulouse, IRIT/INP-ENSEEIHT, France, Feb., 2020.
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling – Complementary results [pdf]Paper  bibtex   
@techreport{Monier_TechReport_2020,
  author       = {E. Monier and Th. Oberlin and N. Brun and M. Tenc\'e and X. Li and N. Dobigeon},
  title        = {Fast reconstruction of atomic-scale {STEM-EELS} images from sparse sampling -- {C}omplementary results},
  institution  = {University of Toulouse, IRIT/INP-ENSEEIHT},
  address      = {France},
  month        = {Feb.},
  year         = {2020}, 
  url          = {http://dobigeon.perso.enseeiht.fr/papers/Monier_TechReport_2020.pdf}
}
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