Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling – Complementary results. Monier, E., Oberlin, T., Brun, N., Tencé, M., Li, X., & Dobigeon, N. Technical Report University of Toulouse, IRIT/INP-ENSEEIHT, France, Feb., 2020. Paper bibtex @techreport{Monier_TechReport_2020,
author = {E. Monier and Th. Oberlin and N. Brun and M. Tenc\'e and X. Li and N. Dobigeon},
title = {Fast reconstruction of atomic-scale {STEM-EELS} images from sparse sampling -- {C}omplementary results},
institution = {University of Toulouse, IRIT/INP-ENSEEIHT},
address = {France},
month = {Feb.},
year = {2020},
url = {http://dobigeon.perso.enseeiht.fr/papers/Monier_TechReport_2020.pdf},
type = {Technical reports}
}
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