Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling – Complementary results. Monier, E., Oberlin, T., Brun, N., Tencé, M., Li, X., & Dobigeon, N. Technical Report University of Toulouse, IRIT/INP-ENSEEIHT, France, Feb., 2020.
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling – Complementary results [pdf]Paper  bibtex   

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