Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?. Moore, W. R., Gronthoud, G., Baker, K., & Lousberg, M. In ITC, pages 95-104, 2000. IEEE Computer Society. Link Paper bibtex @inproceedings{ conf/itc/MooreGBL00,
added-at = {2012-02-08T00:00:00.000+0100},
author = {Moore, Will R. and Gronthoud, Guido and Baker, Keith and Lousberg, Maurice},
biburl = {http://www.bibsonomy.org/bibtex/20bf26f3672d025d393a1d30076903a4e/dblp},
booktitle = {ITC},
crossref = {conf/itc/2000},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894196},
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keywords = {dblp},
pages = {95-104},
publisher = {IEEE Computer Society},
title = {Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MooreGBL00},
year = {2000}
}
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