@inproceedings{ conf/itc/MooreGBL00,
  added-at = {2012-02-08T00:00:00.000+0100},
  author = {Moore, Will R. and Gronthoud, Guido and Baker, Keith and Lousberg, Maurice},
  biburl = {http://www.bibsonomy.org/bibtex/20bf26f3672d025d393a1d30076903a4e/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2000},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894196},
  interhash = {7cc7f15e370a3f562b00f142db1195bc},
  intrahash = {0bf26f3672d025d393a1d30076903a4e},
  keywords = {dblp},
  pages = {95-104},
  publisher = {IEEE Computer Society},
  title = {Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MooreGBL00},
  year = {2000}
}

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