@Article{         Mourrain_1998aa,
  author        = {Mourrain, Ch. and Tourniol, Ch. and Bouzid, M.J.},
  citable       = {1},
  doi           = {10.1016/s0026-2714(98)00139-5},
  file          = {Mourrain_1998aa.pdf},
  group         = {casper},
  internal      = {0},
  issn          = {0026-2714},
  journal       = {Microelectronics Reliability},
  keywords      = {aging,reliability,electronics,mosfet},
  langid        = {english},
  month         = jun,
  number        = {6-8},
  pages         = {1115–1119},
  publisher     = {Elsevier BV},
  title         = {Electrical parameters degradation law of {MOSFET} during ageing},
  volume        = {38},
  year          = {1998},
  shortjournal  = {Microelectron. Reliab.}
}

{"_id":"8zuoAH3ndgNfowGLu","bibbaseid":"mourrain-tourniol-bouzid-electricalparametersdegradationlawofmosfetduringageing-1998","authorIDs":[],"author_short":["Mourrain, C.","Tourniol, C.","Bouzid, M."],"bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Mourrain"],"firstnames":["Ch."],"suffixes":[]},{"propositions":[],"lastnames":["Tourniol"],"firstnames":["Ch."],"suffixes":[]},{"propositions":[],"lastnames":["Bouzid"],"firstnames":["M.J."],"suffixes":[]}],"citable":"1","doi":"10.1016/s0026-2714(98)00139-5","file":"Mourrain_1998aa.pdf","group":"casper","internal":"0","issn":"0026-2714","journal":"Microelectronics Reliability","keywords":"aging,reliability,electronics,mosfet","langid":"english","month":"June","number":"6-8","pages":"1115–1119","publisher":"Elsevier BV","title":"Electrical parameters degradation law of MOSFET during ageing","volume":"38","year":"1998","shortjournal":"Microelectron. Reliab.","bibtex":"@Article{ Mourrain_1998aa,\n author = {Mourrain, Ch. and Tourniol, Ch. and Bouzid, M.J.},\n citable = {1},\n doi = {10.1016/s0026-2714(98)00139-5},\n file = {Mourrain_1998aa.pdf},\n group = {casper},\n internal = {0},\n issn = {0026-2714},\n journal = {Microelectronics Reliability},\n keywords = {aging,reliability,electronics,mosfet},\n langid = {english},\n month = jun,\n number = {6-8},\n pages = {1115–1119},\n publisher = {Elsevier BV},\n title = {Electrical parameters degradation law of {MOSFET} during ageing},\n volume = {38},\n year = {1998},\n shortjournal = {Microelectron. Reliab.}\n}\n\n","author_short":["Mourrain, C.","Tourniol, C.","Bouzid, M."],"key":"Mourrain_1998aa","id":"Mourrain_1998aa","bibbaseid":"mourrain-tourniol-bouzid-electricalparametersdegradationlawofmosfetduringageing-1998","role":"author","urls":{},"keyword":["aging","reliability","electronics","mosfet"],"downloads":0,"html":""},"bibtype":"article","biburl":"http://dl.schoeps.org/database.bib","creationDate":"2019-12-26T16:51:17.708Z","downloads":0,"keywords":["aging","reliability","electronics","mosfet"],"search_terms":["electrical","parameters","degradation","law","mosfet","during","ageing","mourrain","tourniol","bouzid"],"title":"Electrical parameters degradation law of MOSFET during ageing","year":1998,"dataSources":["P4aBgbzF45TWvxzbZ"]}