Transmission electron microscopy study of thermal effects on the free-layer reversal of a crossed-anisotropy spin valve. Murdoch, S. J. T., Chapman, J. N., Pokhil, T. G., Mao, S., & Murdock, E. S. Journal of Applied Physics, 87(9):4945, 2000.
Transmission electron microscopy study of thermal effects on the free-layer reversal of a crossed-anisotropy spin valve [link]Paper  doi  bibtex   
@article{murdoch_transmission_2000,
	title = {Transmission electron microscopy study of thermal effects on the free-layer reversal of a crossed-anisotropy spin valve},
	volume = {87},
	issn = {00218979},
	url = {http://link.aip.org/link/JAPIAU/v87/i9/p4945/s1&Agg=doi},
	doi = {10.1063/1.373210},
	number = {9},
	urldate = {2010-06-25},
	journal = {Journal of Applied Physics},
	author = {Murdoch, S. J. T. and Chapman, J. N. and Pokhil, T. G. and Mao, S. and Murdock, E. S.},
	year = {2000},
	pages = {4945},
}

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