Improved Metrics for Obfuscated ICs,” Government Microcircuit Applications and Critical Technology Conference (GOMACTech). M. Zhu, M. F. & Beerel, P. April 2018. bibtex @conference {Zhu2018,
title = {Improved Metrics for Obfuscated ICs,” Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},
booktitle = {Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},
year = {2018},
month = {April},
address = {Miami, FL},
author = {M. Zhu, M. French, and P. Beerel}
}
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{"_id":"2dagGrT4XkoqKJmh3","bibbaseid":"mzhu-beerel-improvedmetricsforobfuscatedicsgovernmentmicrocircuitapplicationsandcriticaltechnologyconferencegomactech-2018","author_short":["M. Zhu, M. F.","Beerel, P."],"bibdata":{"bibtype":"conference","type":"conference","title":"Improved Metrics for Obfuscated ICs,” Government Microcircuit Applications and Critical Technology Conference (GOMACTech)","booktitle":"Government Microcircuit Applications and Critical Technology Conference (GOMACTech)","year":"2018","month":"April","address":"Miami, FL","author":[{"propositions":[],"lastnames":["M.","Zhu"],"firstnames":["M.","French"],"suffixes":[""]},{"firstnames":["P."],"propositions":[],"lastnames":["Beerel"],"suffixes":[]}],"bibtex":"@conference {Zhu2018,\r\n title = {Improved Metrics for Obfuscated ICs,” Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},\r\n booktitle = {Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},\r\n year = {2018},\r\n month = {April},\r\n address = {Miami, FL},\r\n author = {M. Zhu, M. French, and P. Beerel}\r\n} \r\n \r\n ","author_short":["M. Zhu, M. F.","Beerel, P."],"bibbaseid":"mzhu-beerel-improvedmetricsforobfuscatedicsgovernmentmicrocircuitapplicationsandcriticaltechnologyconferencegomactech-2018","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"conference","biburl":"https://bibbase.org/f/bmA9t7uWu4mwHxyNf/mfrench-2023.bib","dataSources":["iTGGPbkxPJCvmCa3T","xdzEqXoYhRJckM7XG"],"keywords":[],"search_terms":["improved","metrics","obfuscated","ics","government","microcircuit","applications","critical","technology","conference","gomactech","m. zhu","beerel"],"title":"Improved Metrics for Obfuscated ICs,” Government Microcircuit Applications and Critical Technology Conference (GOMACTech)","year":2018}