@article{ ISI:000399610800027,
Author = {Nachaithong, Theeranuch and Kidkhunthod, Pinit and Thongbai, Prasit and
   Maensiri, Santi},
Title = {{Surface barrier layer effect in (In plus Nb) co-doped TiO2 ceramics: An
   alternative route to design low dielectric loss}},
Journal = {{JOURNAL OF THE AMERICAN CERAMIC SOCIETY}},
Year = {{2017}},
Volume = {{100}},
Number = {{4}},
Pages = {{1452-1459}},
Month = {{APR}},
Abstract = {{Giant dielectric permittivity (epsilon) with low loss tangent (tan) was
   reported in (In+Nb) co-doped TiO2 ceramics. Either of electron-pinned
   defect-dipole or internal barrier layer capacitor model was proposed to
   be the origin of this high dielectric performance. Here, we proposed an
   effectively alternative route for designing low-tan in co-doped TiO2
   ceramics by creating a resistive outer surface layer. A pure rutile-TiO2
   phase with a dense microstructure and homogeneous dispersion of dopants
   was achieved in (In+Nb) co-doped TiO2 ceramics prepared by a simple
   sol-gel method. Two giant dielectric responses were observed in low- and
   high-frequency ranges, corresponding to extremely high epsilon
   approximate to 10(6)-10(7) and large epsilon approximate to 10(4)-10(5),
   respectively. After annealing in air, a low-frequency dielectric
   response disappeared and could be restored by removing the outer surface
   of the annealed sample, indicating the dominant electrode effect in the
   initial sample. Annealing can cause improved dielectric properties with
   a temperature- and frequency-independent epsilon value of approximate to
   1.9x10(4) and cause a decrease in tan from 0.1 to 0.035. High dielectric
   performance in (In0.5Nb0.5)(x)Ti1-xO2 ceramics can be achieved by
   eliminating the electrode effect and forming a resistive outer surface
   layer.}},
DOI = {{10.1111/jace.14688}},
ISSN = {{0002-7820}},
EISSN = {{1551-2916}},
Unique-ID = {{ISI:000399610800027}},
}