Use of relative code churn measures to predict system defect density. Nagappan, N. & Ball, T. In ICSE '05: Proceedings of the 27th international conference on Software engineering, pages 284--292, New York, NY, USA, 2005. ACM.
doi  bibtex   
@inproceedings{ nagappan-icse05,
  author = {Nagappan, Nachiappan and Ball, Thomas},
  title = {Use of relative code churn measures to predict system defect density},
  booktitle = {ICSE '05: Proceedings of the 27th international conference on Software engineering},
  year = {2005},
  isbn = {1-59593-963-2},
  pages = {284--292},
  location = {St. Louis, MO, USA},
  doi = {http://doi.acm.org/10.1145/1062455.1062514},
  publisher = {ACM},
  address = {New York, NY, USA}
}

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