Use of relative code churn measures to predict system defect density. Nagappan, N. & Ball, T. In ICSE '05: Proceedings of the 27th international conference on Software engineering, pages 284--292, New York, NY, USA, 2005. ACM. doi bibtex @inproceedings{ nagappan-icse05,
author = {Nagappan, Nachiappan and Ball, Thomas},
title = {Use of relative code churn measures to predict system defect density},
booktitle = {ICSE '05: Proceedings of the 27th international conference on Software engineering},
year = {2005},
isbn = {1-59593-963-2},
pages = {284--292},
location = {St. Louis, MO, USA},
doi = {http://doi.acm.org/10.1145/1062455.1062514},
publisher = {ACM},
address = {New York, NY, USA}
}
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