Improving Smartphone Security and Reliability. Neamtiu, I., Wei, X., Faloutsos, M., Gomez, L., Azim, T., Hu, Y., & Shan, Z. J. Interconnect. Networks, 17(1):1740002:1–1740002:67, 2017.
Paper doi bibtex @article{DBLP:journals/join/NeamtiuWFGAHS17,
author = {Iulian Neamtiu and
Xuetao Wei and
Michalis Faloutsos and
Lorenzo Gomez and
Tanzirul Azim and
Yongjian Hu and
Zhiyong Shan},
title = {Improving Smartphone Security and Reliability},
journal = {J. Interconnect. Networks},
volume = {17},
number = {1},
pages = {1740002:1--1740002:67},
year = {2017},
url = {https://doi.org/10.1142/S0219265917400023},
doi = {10.1142/S0219265917400023},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/join/NeamtiuWFGAHS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
Downloads: 0
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