Improving Smartphone Security and Reliability. Neamtiu, I., Wei, X., Faloutsos, M., Gomez, L., Azim, T., Hu, Y., & Shan, Z. J. Interconnect. Networks, 17(1):1740002:1–1740002:67, 2017.
Improving Smartphone Security and Reliability [link]Paper  doi  bibtex   
@article{DBLP:journals/join/NeamtiuWFGAHS17,
  author    = {Iulian Neamtiu and
               Xuetao Wei and
               Michalis Faloutsos and
               Lorenzo Gomez and
               Tanzirul Azim and
               Yongjian Hu and
               Zhiyong Shan},
  title     = {Improving Smartphone Security and Reliability},
  journal   = {J. Interconnect. Networks},
  volume    = {17},
  number    = {1},
  pages     = {1740002:1--1740002:67},
  year      = {2017},
  url       = {https://doi.org/10.1142/S0219265917400023},
  doi       = {10.1142/S0219265917400023},
  timestamp = {Fri, 05 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/join/NeamtiuWFGAHS17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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