Improving Smartphone Security and Reliability. Neamtiu, I., Wei, X., Faloutsos, M., Gomez, L., Azim, T., Hu, Y., & Shan, Z. J. Interconnect. Networks, 17(1):1740002:1–1740002:67, 2017.
Improving Smartphone Security and Reliability [link]Paper  doi  bibtex   
@article{DBLP:journals/join/NeamtiuWFGAHS17,
  author       = {Iulian Neamtiu and
                  Xuetao Wei and
                  Michalis Faloutsos and
                  Lorenzo Gomez and
                  Tanzirul Azim and
                  Yongjian Hu and
                  Zhiyong Shan},
  title        = {Improving Smartphone Security and Reliability},
  journal      = {J. Interconnect. Networks},
  volume       = {17},
  number       = {1},
  pages        = {1740002:1--1740002:67},
  year         = {2017},
  url          = {https://doi.org/10.1142/S0219265917400023},
  doi          = {10.1142/S0219265917400023},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/join/NeamtiuWFGAHS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0