Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy. Newbury, D. E. Journal of research of the National Institute of Standards and Technology, 107(6):605, 2002.
Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy [link]Paper  bibtex   
@article{newbury_barriers_2002,
	title = {Barriers to quantitative electron probe {X}-ray microanalysis for low voltage scanning electron microscopy},
	volume = {107},
	url = {https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863847/},
	number = {6},
	urldate = {2017-09-06},
	journal = {Journal of research of the National Institute of Standards and Technology},
	author = {Newbury, Dale E.},
	year = {2002},
	pages = {605},
}

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