Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy. Newbury, D. E. Journal of research of the National Institute of Standards and Technology, 107(6):605, 2002. ![Barriers to quantitative electron probe X-ray microanalysis for low voltage scanning electron microscopy [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper bibtex @article{newbury_barriers_2002,
title = {Barriers to quantitative electron probe {X}-ray microanalysis for low voltage scanning electron microscopy},
volume = {107},
url = {https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863847/},
number = {6},
urldate = {2017-09-06},
journal = {Journal of research of the National Institute of Standards and Technology},
author = {Newbury, Dale E.},
year = {2002},
pages = {605},
}
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