Image Formation in the Scanning Electron Microscope. Newbury, D. E. In Goldstein, J. I. & Yakowitz, H., editors, Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, pages 95–148. Springer US, Boston, MA, 1975. 00000 ![Image Formation in the Scanning Electron Microscope [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex To understand the process of image formation in the scanning electron microscope, we must examine the component parts of the image formation system: the scanning system, the signal detectors, the amplifiers, and the display. For this discussion, the upper portion of the electron probe forming system, i.e., the electron gun and the upper condenser lenses, is relatively unimportant. Details of these components have been given in the discussion of electron optics in Chapter II. The entire instrument is discussed in detail by Oatley.(1) We shall assume that a focused electron probe of diameter d p is produced by the electron gun and lenses. The components of the image formation system are illustrated in Figure 1, and with this diagram we shall follow the sequence of events in the formation of the image. The electron beam travels down the optical axis of the electron optical column from the gun through the first two condenser lenses with each lens progressively demagnifying the beam. When the beam encounters the first set of scan coils, it is deflected off the optical axis. The second (lower) set of scan coils acts on the deflected beam and produces a second deflection, causing the beam to again cross through the optical axis. The scan coils rest in the bore of the final lens, and during passage Open image in new window FIGURE 1. Image formation system in the scanning electron microscope. FA, final aperture; SD, solid state electron detector; ET, Everhart-Thornley electron detector; PM, photomultiplier; S, scintillator; W, ED, wavelength- and/or energy-dispersive x-ray detectors; CRT, cathode ray tube. of the scan coils, the beam is further demagnified by the action of this lens, which is normally the strongest lens in the microscope.
@incollection{newbury_image_1975,
address = {Boston, MA},
title = {Image {Formation} in the {Scanning} {Electron} {Microscope}},
isbn = {978-1-4613-4422-3},
url = {https://doi.org/10.1007/978-1-4613-4422-3_4},
abstract = {To understand the process of image formation in the scanning electron microscope, we must examine the component parts of the image formation system: the scanning system, the signal detectors, the amplifiers, and the display. For this discussion, the upper portion of the electron probe forming system, i.e., the electron gun and the upper condenser lenses, is relatively unimportant. Details of these components have been given in the discussion of electron optics in Chapter II. The entire instrument is discussed in detail by Oatley.(1) We shall assume that a focused electron probe of diameter d p is produced by the electron gun and lenses. The components of the image formation system are illustrated in Figure 1, and with this diagram we shall follow the sequence of events in the formation of the image. The electron beam travels down the optical axis of the electron optical column from the gun through the first two condenser lenses with each lens progressively demagnifying the beam. When the beam encounters the first set of scan coils, it is deflected off the optical axis. The second (lower) set of scan coils acts on the deflected beam and produces a second deflection, causing the beam to again cross through the optical axis. The scan coils rest in the bore of the final lens, and during passage Open image in new window FIGURE 1. Image formation system in the scanning electron microscope. FA, final aperture; SD, solid state electron detector; ET, Everhart-Thornley electron detector; PM, photomultiplier; S, scintillator; W, ED, wavelength- and/or energy-dispersive x-ray detectors; CRT, cathode ray tube. of the scan coils, the beam is further demagnified by the action of this lens, which is normally the strongest lens in the microscope.},
language = {en},
urldate = {2020-03-28},
booktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},
publisher = {Springer US},
author = {Newbury, D. E.},
editor = {Goldstein, Joseph I. and Yakowitz, Harvey},
year = {1975},
doi = {10.1007/978-1-4613-4422-3_4},
note = {00000 },
keywords = {Backscatter Electron, Contrast Mechanism, Faraday Cage, Picture Element, Secondary Electron},
pages = {95--148},
}
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{"_id":"qZT2275gX3aMrbT4M","bibbaseid":"newbury-imageformationinthescanningelectronmicroscope-1975","author_short":["Newbury, D. E."],"bibdata":{"bibtype":"incollection","type":"incollection","address":"Boston, MA","title":"Image Formation in the Scanning Electron Microscope","isbn":"978-1-4613-4422-3","url":"https://doi.org/10.1007/978-1-4613-4422-3_4","abstract":"To understand the process of image formation in the scanning electron microscope, we must examine the component parts of the image formation system: the scanning system, the signal detectors, the amplifiers, and the display. For this discussion, the upper portion of the electron probe forming system, i.e., the electron gun and the upper condenser lenses, is relatively unimportant. Details of these components have been given in the discussion of electron optics in Chapter II. The entire instrument is discussed in detail by Oatley.(1) We shall assume that a focused electron probe of diameter d p is produced by the electron gun and lenses. The components of the image formation system are illustrated in Figure 1, and with this diagram we shall follow the sequence of events in the formation of the image. The electron beam travels down the optical axis of the electron optical column from the gun through the first two condenser lenses with each lens progressively demagnifying the beam. When the beam encounters the first set of scan coils, it is deflected off the optical axis. The second (lower) set of scan coils acts on the deflected beam and produces a second deflection, causing the beam to again cross through the optical axis. The scan coils rest in the bore of the final lens, and during passage Open image in new window FIGURE 1. Image formation system in the scanning electron microscope. FA, final aperture; SD, solid state electron detector; ET, Everhart-Thornley electron detector; PM, photomultiplier; S, scintillator; W, ED, wavelength- and/or energy-dispersive x-ray detectors; CRT, cathode ray tube. of the scan coils, the beam is further demagnified by the action of this lens, which is normally the strongest lens in the microscope.","language":"en","urldate":"2020-03-28","booktitle":"Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis","publisher":"Springer US","author":[{"propositions":[],"lastnames":["Newbury"],"firstnames":["D.","E."],"suffixes":[]}],"editor":[{"propositions":[],"lastnames":["Goldstein"],"firstnames":["Joseph","I."],"suffixes":[]},{"propositions":[],"lastnames":["Yakowitz"],"firstnames":["Harvey"],"suffixes":[]}],"year":"1975","doi":"10.1007/978-1-4613-4422-3_4","note":"00000 ","keywords":"Backscatter Electron, Contrast Mechanism, Faraday Cage, Picture Element, Secondary Electron","pages":"95–148","bibtex":"@incollection{newbury_image_1975,\n\taddress = {Boston, MA},\n\ttitle = {Image {Formation} in the {Scanning} {Electron} {Microscope}},\n\tisbn = {978-1-4613-4422-3},\n\turl = {https://doi.org/10.1007/978-1-4613-4422-3_4},\n\tabstract = {To understand the process of image formation in the scanning electron microscope, we must examine the component parts of the image formation system: the scanning system, the signal detectors, the amplifiers, and the display. For this discussion, the upper portion of the electron probe forming system, i.e., the electron gun and the upper condenser lenses, is relatively unimportant. Details of these components have been given in the discussion of electron optics in Chapter II. The entire instrument is discussed in detail by Oatley.(1) We shall assume that a focused electron probe of diameter d p is produced by the electron gun and lenses. The components of the image formation system are illustrated in Figure 1, and with this diagram we shall follow the sequence of events in the formation of the image. The electron beam travels down the optical axis of the electron optical column from the gun through the first two condenser lenses with each lens progressively demagnifying the beam. When the beam encounters the first set of scan coils, it is deflected off the optical axis. The second (lower) set of scan coils acts on the deflected beam and produces a second deflection, causing the beam to again cross through the optical axis. The scan coils rest in the bore of the final lens, and during passage Open image in new window FIGURE 1. Image formation system in the scanning electron microscope. FA, final aperture; SD, solid state electron detector; ET, Everhart-Thornley electron detector; PM, photomultiplier; S, scintillator; W, ED, wavelength- and/or energy-dispersive x-ray detectors; CRT, cathode ray tube. of the scan coils, the beam is further demagnified by the action of this lens, which is normally the strongest lens in the microscope.},\n\tlanguage = {en},\n\turldate = {2020-03-28},\n\tbooktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},\n\tpublisher = {Springer US},\n\tauthor = {Newbury, D. E.},\n\teditor = {Goldstein, Joseph I. and Yakowitz, Harvey},\n\tyear = {1975},\n\tdoi = {10.1007/978-1-4613-4422-3_4},\n\tnote = {00000 },\n\tkeywords = {Backscatter Electron, Contrast Mechanism, Faraday Cage, Picture Element, Secondary Electron},\n\tpages = {95--148},\n}\n\n","author_short":["Newbury, D. E."],"editor_short":["Goldstein, J. 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