Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope. Newbury, D. E. & Yakowitz, H. In Goldstein, J. I. & Yakowitz, H., editors, Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, pages 211–262. Springer US, Boston, MA, 1975. 00000 ![Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex In the first ten years of commercial availability of the scanning electron microscope (SEM), the instrument has been applied in many fields in the physical and biological sciences. In this chapter, we shall present illustrative examples of the types of problems in materials science for which the SEM can provide useful information to the analyst. By no means are these examples a complete description of the scope of SEM applications. A more adequate appreciation of the wide range of SEM studies that have been carried out can be obtained by consulting the proceedings of the yearly conferences on scanning electron microscopy.(1,2)
@incollection{newbury_specimen_1975,
address = {Boston, MA},
title = {Specimen {Preparation}, {Special} {Techniques}, and {Applications} of the {Scanning} {Electron} {Microscope}},
isbn = {978-1-4613-4422-3},
url = {https://doi.org/10.1007/978-1-4613-4422-3_6},
abstract = {In the first ten years of commercial availability of the scanning electron microscope (SEM), the instrument has been applied in many fields in the physical and biological sciences. In this chapter, we shall present illustrative examples of the types of problems in materials science for which the SEM can provide useful information to the analyst. By no means are these examples a complete description of the scope of SEM applications. A more adequate appreciation of the wide range of SEM studies that have been carried out can be obtained by consulting the proceedings of the yearly conferences on scanning electron microscopy.(1,2)},
language = {en},
urldate = {2020-03-28},
booktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},
publisher = {Springer US},
author = {Newbury, D. E. and Yakowitz, H.},
editor = {Goldstein, Joseph I. and Yakowitz, Harvey},
year = {1975},
doi = {10.1007/978-1-4613-4422-3_6},
note = {00000 },
keywords = {Annealing Twin, Chapter Versus, NAND Gate, Secondary Electron Emission, Stripe Domain},
pages = {211--262},
}
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