Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. Ney, A., Girard, P., Landrault, C., Pravossoudovitch, S., Virazel, A., & Bastian, M. In Proceedings of European Test Symposium, pages 97-104, 2007. Paper bibtex @inproceedings{ dblp3116785,
title = {Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs},
author = {Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},
author_short = {Ney, A. and Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A. and Bastian, M.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2007},
key = {dblp3116785},
id = {dblp3116785},
biburl = {http://www.dblp.org/rec/bibtex/conf/ets/NeyGLPVB07},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2007.19},
conference = {European Test Symposium},
pages = {97-104},
text = {European Test Symposium 2007:97-104},
booktitle = {Proceedings of European Test Symposium}
}
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