@inproceedings{ dblp3103918,
  title = {Slow write driver faults in 65nm SRAM technology: analysis and March test solution},
  author = {Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},
  author_short = {Ney, A. and Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A. and Bastian, M.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2007},
  key = {dblp3103918},
  id = {dblp3103918},
  biburl = {http://www.dblp.org/rec/bibtex/conf/date/NeyGLPVB07},
  url = {http://doi.acm.org/10.1145/1266366.1266479},
  conference = {DATE},
  pages = {528-533},
  text = {DATE 2007:528-533},
  booktitle = {Proceedings of Design, Automation, and Test in Europe (DATE)}
}

{"_id":"e7BXwod8Ed54Gh2bX","bibbaseid":"ney-girard-landrault-pravossoudovitch-virazel-bastian-slowwritedriverfaultsin65nmsramtechnologyanalysisandmarchtestsolution-2007","downloads":0,"creationDate":"2015-04-07T17:36:59.743Z","title":"Slow write driver faults in 65nm SRAM technology: analysis and March test solution","author_short":["Ney, A.","Girard, P.","Landrault, C.","Pravossoudovitch, S.","Virazel, A.","Bastian, M."],"year":2007,"bibtype":"inproceedings","biburl":"http://www.dblp.org/rec/bibtex/conf/date/NeyGLPVB07","bibdata":{"title":"Slow write driver faults in 65nm SRAM technology: analysis and March test solution","author":["Alexandre Ney","Patrick Girard","Christian Landrault","Serge Pravossoudovitch","Arnaud Virazel","Magali Bastian"],"author_short":["Ney, A.","Girard, P.","Landrault, C.","Pravossoudovitch, S.","Virazel, A.","Bastian, M."],"bibtype":"inproceedings","type":"inproceedings","year":"2007","key":"dblp3103918","id":"dblp3103918","biburl":"http://www.dblp.org/rec/bibtex/conf/date/NeyGLPVB07","url":"http://doi.acm.org/10.1145/1266366.1266479","conference":"DATE","pages":"528-533","text":"DATE 2007:528-533","booktitle":"Proceedings of Design, Automation, and Test in Europe (DATE)","bibtex":"@inproceedings{ dblp3103918,\n title = {Slow write driver faults in 65nm SRAM technology: analysis and March test solution},\n author = {Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},\n author_short = {Ney, A. and Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A. and Bastian, M.},\n bibtype = {inproceedings},\n type = {inproceedings},\n year = {2007},\n key = {dblp3103918},\n id = {dblp3103918},\n biburl = {http://www.dblp.org/rec/bibtex/conf/date/NeyGLPVB07},\n url = {http://doi.acm.org/10.1145/1266366.1266479},\n conference = {DATE},\n pages = {528-533},\n text = {DATE 2007:528-533},\n booktitle = {Proceedings of Design, Automation, and Test in Europe (DATE)}\n}","bibbaseid":"ney-girard-landrault-pravossoudovitch-virazel-bastian-slowwritedriverfaultsin65nmsramtechnologyanalysisandmarchtestsolution-2007","role":"author","urls":{"Paper":"http://doi.acm.org/10.1145/1266366.1266479"},"downloads":0},"search_terms":["slow","write","driver","faults","65nm","sram","technology","analysis","march","test","solution","ney","girard","landrault","pravossoudovitch","virazel","bastian"],"keywords":[],"authorIDs":[],"dataSources":["NNxXdMqQckjpdRn8Y"]}