Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. Ney, A., Girard, P., Landrault, C., Pravossoudovitch, S., Virazel, A., & Bastian, M. In Proceedings of VLSI Test Symposium (VTS), pages 361-368, 2007. Paper bibtex @inproceedings{ dblp3230918,
title = {Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs},
author = {Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},
author_short = {Ney, A. and Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A. and Bastian, M.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2007},
key = {dblp3230918},
id = {dblp3230918},
biburl = {http://www.dblp.org/rec/bibtex/conf/vts/NeyGLPVB07},
url = {http://dx.doi.org/10.1109/VTS.2007.84},
conference = {VTS},
pages = {361-368},
text = {VTS 2007:361-368},
booktitle = {Proceedings of VLSI Test Symposium (VTS)}
}
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