Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision. Nguyen, V. H., Pham, V. H., Cui, X., Ma, M., & Kim, H. Journal of Information and Telecommunication, 1(4):334--350, 2017.
bibtex   
@article{nguyen_design_2017,
	title = {Design and evaluation of features and classifiers for {OLED} panel defect recognition in machine vision},
	volume = {1},
	number = {4},
	journal = {Journal of Information and Telecommunication},
	author = {Nguyen, Van Huan and Pham, Van Huy and Cui, Xuenan and Ma, Mingjie and Kim, Hakil},
	year = {2017},
	pages = {334--350}
}
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