Characterizing Temperature, Power, and Soft-Error Behaviors in Data Center Systems: Insights, Challenges, and Opportunities. Nie, B., Xue, J., Gupta, S., Engelmann, C., Smirni, E., & Tiwari, D. In 25th IEEE International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems, MASCOTS 2017, Banff, AB, Canada, September 20-22, 2017, pages 22–31, 2017. IEEE Computer Society.
Characterizing Temperature, Power, and Soft-Error Behaviors in Data Center Systems: Insights, Challenges, and Opportunities [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/mascots/NieXGEST17,
  author    = {Bin Nie and
               Ji Xue and
               Saurabh Gupta and
               Christian Engelmann and
               Evgenia Smirni and
               Devesh Tiwari},
  title     = {Characterizing Temperature, Power, and Soft-Error Behaviors in Data
               Center Systems: Insights, Challenges, and Opportunities},
  booktitle = {25th {IEEE} International Symposium on Modeling, Analysis, and Simulation
               of Computer and Telecommunication Systems, {MASCOTS} 2017, Banff,
               AB, Canada, September 20-22, 2017},
  pages     = {22--31},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://doi.org/10.1109/MASCOTS.2017.12},
  doi       = {10.1109/MASCOTS.2017.12},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/mascots/NieXGEST17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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