Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry. Niemeyer, T., Meyer, K., Flathmann, C., Meyer, T., Schaadt, D. M., & Seibt, M. Journal of Crystal Growth, 602:126972, Elsevier BV, 2023. ![Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{10.1016/j.jcrysgro.2022.126972,
doi = {10.1016/j.jcrysgro.2022.126972},
url = {http://dx.doi.org/10.1016/j.jcrysgro.2022.126972},
year = 2023,
publisher = {Elsevier {BV}},
volume = {602},
pages = {126972},
author = {Tobias Niemeyer and Kevin Meyer and Christoph Flathmann and Tobias Meyer and Daniel M. Schaadt and Michael Seibt},
title = {Microstructural analysis of {GaN} films grown on (1 0 0) {MgF}2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry},
journal = {Journal of Crystal Growth}
}
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