BPPT - Bulk potential protection technique for hardened sequentials. Nofal, I., Evans, A., He, A., Guo, G., Li, Y., Chen, L., Liu, R., Wang, H., Chen, M., Baeg, S. H., Wen, S., & Wong, R. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017, pages 28–32, 2017. IEEE.
BPPT - Bulk potential protection technique for hardened sequentials [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author    = {Issam Nofal and
               Adrian Evans and
               A.{-}L. He and
               Gang Guo and
               Yuanqing Li and
               Li Chen and
               Rui Liu and
               Haibin Wang and
               Mo Chen and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
               System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages     = {28--32},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi       = {10.1109/IOLTS.2017.8046194},
  timestamp = {Wed, 20 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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