@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author       = {Issam Nofal and
                  Adrian Evans and
                  Anlin He and
                  Gang Guo and
                  Yuanqing Li and
                  Li Chen and
                  Rui Liu and
                  Haibin Wang and
                  Mo Chen and
                  Sang H. Baeg and
                  Shi{-}Jie Wen and
                  Richard Wong},
  title        = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {28--32},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi          = {10.1109/IOLTS.2017.8046194},
  timestamp    = {Wed, 26 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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