Edge-based texture measures for surface inspection. Ojala, T., Pietikainen, M., & Silven, O. In Proc. 11th International Conference on Pattern Recognition, , volume 2, pages 594-598, The Hague, The Netherlands, 1992. bibtex @Inproceedings{Ojala_1992_2109,
author = {Ojala, T. and Pietikainen, M. and Silven, O.},
address = {The Hague, The Netherlands},
booktitle = {Proc. 11th International Conference on Pattern Recognition, },
pages = {594-598},
title = {Edge-based texture measures for surface inspection},
volume = {2},
year = {1992},
title_with_no_special_chars = {Edgebased texture measures for surface inspection}
}
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