Edge-based texture measures for surface inspection. Ojala, T., Pietikainen, M., & Silven, O. In Proc. 11th International Conference on Pattern Recognition, , volume 2, pages 594-598, The Hague, The Netherlands, 1992.
bibtex   
@Inproceedings{Ojala_1992_2109,
  author = {Ojala, T. and Pietikainen, M. and Silven, O.},
 address = {The Hague, The Netherlands},
 booktitle = {Proc. 11th International Conference on Pattern Recognition, },
 pages = {594-598},
 title = {Edge-based texture measures for surface inspection},
 volume = {2},
 year = {1992},
 title_with_no_special_chars = {Edgebased texture measures for surface inspection}
}

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