@article{Oliver2021,
    author = {Oliver, Sean M. and Martynowych, Dmitro J. and Turne, Matthew J. and Hopper, David A. and Walswort, Ronald L. and Levine, Edlyn V.},
    title = "{Vector Magnetic Current Imaging of an 8 nm Process Node Chip and 3D Current Distributions Using the Quantum Diamond Microscope}",
    volume = {ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis},
    series = {International Symposium for Testing and Failure Analysis},
    pages = {96-107},
    year = {2021},
    month = {10},
    comment = {10},
    doi = {10.31399/asm.cp.istfa2021p0096},
    url_link = {https://doi.org/10.31399/asm.cp.istfa2021p0096},
    url_pdf = {https://blog.umd.edu/walsworth/files/2020/08/2021_Oliver_ISTFA.pdf},
    keywords = {quantum-sensing}
}

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