Thin film PID field failures and root cause determination. Olsson, N. A., Richardson, M. C., & Hevelone, J. In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC) Volume 2, pages 1–4, June, 2014. doi abstract bibtex Potential Induced Degradation (PID) manifests itself as a pre-mature degradation of solar module performance that is dependent on the relative position of the module in a series connected string of modules. In this paper we describe a particular type of PID not previously documented that was experienced in an actual field installation. Measurements and analysis show that the PID originates from current shunt paths in the laser scribes of the monolithically integrated thin-film modules. Root cause of the shunt paths are found to be field driven sodium migration from the glass substrate into the scribe lines causing a severe degradation of the module shunt resistance.
@inproceedings{olsson_thin_2014,
title = {Thin film {PID} field failures and root cause determination},
doi = {10.1109/PVSC-Vol2.2014.7588250},
abstract = {Potential Induced Degradation (PID) manifests itself as a pre-mature degradation of solar module performance that is dependent on the relative position of the module in a series connected string of modules. In this paper we describe a particular type of PID not previously documented that was experienced in an actual field installation. Measurements and analysis show that the PID originates from current shunt paths in the laser scribes of the monolithically integrated thin-film modules. Root cause of the shunt paths are found to be field driven sodium migration from the glass substrate into the scribe lines causing a severe degradation of the module shunt resistance.},
booktitle = {2014 {IEEE} 40th {Photovoltaic} {Specialists} {Conference} ({PVSC}) {Volume} 2},
author = {Olsson, N. A. and Richardson, M. C. and Hevelone, J.},
month = jun,
year = {2014},
keywords = {Degradation, Films, Glass, Resistance, Rsh, Semiconductor device measurement, Sodium, Temperature measurement, diffusion, field driven sodium migration, glass substrate, laser scribes, module shunt resistance, monolithically integrated, monolithically integrated thin-film modules, potential induced degradation, root cause determination, scribe lines, shunt paths, sodium, solar cells, solar module, substrates, thin film, thin film PID field failures, thin film devices},
pages = {1--4}
}
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