Large area strain analysis using scanning transmission electron microscopy across multiple images. Oni, A A, Sang, X, Raju, S V, Dumpala, S, Broderick, S, Kumar, A, Sinnott, S, Saxena, S, Rajan, K, & LeBeau, J M Applied physics letters, 106:011601, AIP Publishing, 5 January, 2015.
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@ARTICLE{Oni2015-yz,
  title     = "{Large area strain analysis using scanning transmission electron
               microscopy across multiple images}",
  author    = "Oni, A A and Sang, X and Raju, S V and Dumpala, S and Broderick,
               S and Kumar, A and Sinnott, S and Saxena, S and Rajan, K and
               LeBeau, J M",
  journal   = "Applied physics letters",
  publisher = "AIP Publishing",
  volume    =  106,
  pages     =  011601,
  month     =  "5~" # jan,
  year      =  2015,
  keywords  = "LeBeau Group",
  doi       = "10.1063/1.4905368"
}

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