Large area strain analysis using scanning transmission electron microscopy across multiple images. Oni, A A, Sang, X, Raju, S V, Dumpala, S, Broderick, S, Kumar, A, Sinnott, S, Saxena, S, Rajan, K, & LeBeau, J M Applied physics letters, 106:011601, AIP Publishing, 5 January, 2015. doi bibtex 1 download @ARTICLE{Oni2015-yz,
title = "{Large area strain analysis using scanning transmission electron
microscopy across multiple images}",
author = "Oni, A A and Sang, X and Raju, S V and Dumpala, S and Broderick,
S and Kumar, A and Sinnott, S and Saxena, S and Rajan, K and
LeBeau, J M",
journal = "Applied physics letters",
publisher = "AIP Publishing",
volume = 106,
pages = 011601,
month = "5~" # jan,
year = 2015,
keywords = "LeBeau Group",
doi = "10.1063/1.4905368"
}
% The entry below contains non-ASCII chars that could not be converted
% to a LaTeX equivalent.
Downloads: 1
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