Electrical switching and conduction mechanisms of nonvolatile write-once-read-many-times memory devices with ZnO nanoparticles embedded in polyvinylpyrrolidone. Onlaor, K., Thiwawong, T., & Tunhoo, B. ORGANIC ELECTRONICS, 15(6):1254-1262, JUN, 2014. doi abstract bibtex We reported on the influence of zinc oxide nanoparticles (ZnO NPs) on the electrical bistable behavior of nonvolatile write-once-read-many-times (WORM) memory devices based on an indium- tin oxide/polyvinylpyrrolidone (PVP): ZnO NPs/aluminum (ITO/PVP: ZnO/Al) structure. The maximum ON/OFF current ratio of the nonvolatile WORM memory devices was approximately 3 Chi 10(3) and the devices remained in the ON state even after the applied voltage was turned off. In addition, reliability studies for response time and once write/continuous read operations of the optimal ZnO NPs concentration are presented. The response times of both rise-time and fall-time were about 3 and 6 mu s respectively. The conduction mechanisms of all voltage regions of the device were analyzed by theoretical models and electron trapping in the ZnO NPs of the electron tunneling among a PVP matrix was discussed. (C) 2014 Elsevier B.V. All rights reserved.
@article{ ISI:000334740100024,
Author = {Onlaor, K. and Thiwawong, T. and Tunhoo, B.},
Title = {{Electrical switching and conduction mechanisms of nonvolatile
write-once-read-many-times memory devices with ZnO nanoparticles
embedded in polyvinylpyrrolidone}},
Journal = {{ORGANIC ELECTRONICS}},
Year = {{2014}},
Volume = {{15}},
Number = {{6}},
Pages = {{1254-1262}},
Month = {{JUN}},
Abstract = {{We reported on the influence of zinc oxide nanoparticles (ZnO NPs) on
the electrical bistable behavior of nonvolatile
write-once-read-many-times (WORM) memory devices based on an indium- tin
oxide/polyvinylpyrrolidone (PVP): ZnO NPs/aluminum (ITO/PVP: ZnO/Al)
structure. The maximum ON/OFF current ratio of the nonvolatile WORM
memory devices was approximately 3 Chi 10(3) and the devices remained in
the ON state even after the applied voltage was turned off. In addition,
reliability studies for response time and once write/continuous read
operations of the optimal ZnO NPs concentration are presented. The
response times of both rise-time and fall-time were about 3 and 6 mu s
respectively. The conduction mechanisms of all voltage regions of the
device were analyzed by theoretical models and electron trapping in the
ZnO NPs of the electron tunneling among a PVP matrix was discussed. (C)
2014 Elsevier B.V. All rights reserved.}},
DOI = {{10.1016/j.orgel.2014.03.024}},
ISSN = {{1566-1199}},
EISSN = {{1878-5530}},
Unique-ID = {{ISI:000334740100024}},
}
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