Silk texture defect recognition system using computer vision and artificial neural networks. Oonsivilai, A. & Meeboon, N. In 2009 2nd International Congress on Image and Signal Processing, pages 1–4, 2009. IEEE.
bibtex   
@inproceedings{oonsivilai2009silk,
  title={Silk texture defect recognition system using computer vision and artificial neural networks},
  author={Oonsivilai, Anant and Meeboon, Nittaya},
  booktitle={2009 2nd International Congress on Image and Signal Processing},
  pages={1--4},
  year={2009},
  organization={IEEE}
}

Downloads: 0