Evaluation of Refractive Index Variations of TiO2:SiO2:Zr Thin Films by Molar Ratio. Oral, Z., B., B. ACTA PHYSICA POLONICA A, 127(4):1314-1316, 2015.
abstract   bibtex   
Zr-doped and undoped TiO2-SiO2 thin films were fabricated by using sol-gel dip coating. TiO2:SiO2:Zr films with different molar ratio were coated on glass substrates. Refractive indexes and the thicknesses of thin films were measured with Metricon 2010 Prism Coupler. The theoretical and measured refractive indexes of thin films were found to be consistently changing with molar ratio. The measured refractive indexes of thin films were lower than the theoretical ones due to the porosity of the structure.
@article{
 title = {Evaluation of Refractive Index Variations of TiO2:SiO2:Zr Thin Films by Molar Ratio},
 type = {article},
 year = {2015},
 identifiers = {[object Object]},
 pages = {1314-1316},
 volume = {127},
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 created = {2016-04-28T08:46:12.000Z},
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 last_modified = {2016-04-28T08:46:12.000Z},
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 hidden = {false},
 citation_key = {ISI:000357937100127},
 source_type = {article},
 abstract = {Zr-doped and undoped TiO2-SiO2 thin films were fabricated by using
sol-gel dip coating. TiO2:SiO2:Zr films with different molar ratio were
coated on glass substrates. Refractive indexes and the thicknesses of
thin films were measured with Metricon 2010 Prism Coupler. The
theoretical and measured refractive indexes of thin films were found to
be consistently changing with molar ratio. The measured refractive
indexes of thin films were lower than the theoretical ones due to the
porosity of the structure.},
 bibtype = {article},
 author = {Oral, Z B Bahsi},
 journal = {ACTA PHYSICA POLONICA A},
 number = {4}
}

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