A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models. Pajona, O., Aupetit-Berthelemot, C., & Dumas, J. Microelectron. Reliab., 47(9-11):1643-1648, 2007.
A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models. [link]Link  A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models. [link]Paper  bibtex   
@article{journals/mr/PajonaAD07,
  added-at = {2020-02-22T00:00:00.000+0100},
  author = {Pajona, O. and Aupetit-Berthelemot, Christelle and Dumas, Jean-Michel},
  biburl = {https://www.bibsonomy.org/bibtex/24ff1a635496c7aff8b8845aebae8d7cf/dblp},
  ee = {https://doi.org/10.1016/j.microrel.2007.07.063},
  interhash = {b3191c8e23a6cfe1243c88082dfb6719},
  intrahash = {4ff1a635496c7aff8b8845aebae8d7cf},
  journal = {Microelectron. Reliab.},
  keywords = {dblp},
  number = {9-11},
  pages = {1643-1648},
  timestamp = {2020-02-25T13:29:47.000+0100},
  title = {A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#PajonaAD07},
  volume = 47,
  year = 2007
}

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