Density Biased Sampling: An Improved Method for Data Mining and Clustering. Palmer, C. R. & Faloutsos, C. In Chen, W., Naughton, J. F., & Bernstein, P. A., editors, Proceedings of the 2000 ACM SIGMOD International Conference on Management of Data, May 16-18, 2000, Dallas, Texas, USA, pages 82–92, 2000. ACM.
Density Biased Sampling: An Improved Method for Data Mining and Clustering [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/sigmod/PalmerF00,
  author       = {Christopher R. Palmer and
                  Christos Faloutsos},
  editor       = {Weidong Chen and
                  Jeffrey F. Naughton and
                  Philip A. Bernstein},
  title        = {Density Biased Sampling: An Improved Method for Data Mining and Clustering},
  booktitle    = {Proceedings of the 2000 {ACM} {SIGMOD} International Conference on
                  Management of Data, May 16-18, 2000, Dallas, Texas, {USA}},
  pages        = {82--92},
  publisher    = {{ACM}},
  year         = {2000},
  url          = {https://doi.org/10.1145/342009.335384},
  doi          = {10.1145/342009.335384},
  timestamp    = {Fri, 12 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/sigmod/PalmerF00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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