@article{journals/mr/PalumboCLPTT05,
  added-at = {2016-01-29T00:00:00.000+0100},
  author = {Palumbo, Felix and Condorelli, G. and Lombardo, Salvatore and Pey, K. L. and Tung, C. H. and Tang, L. J.},
  biburl = {http://www.bibsonomy.org/bibtex/2800ca9011b57cee6230e8b9854a619f6/dblp},
  ee = {http://dx.doi.org/10.1016/j.microrel.2004.11.034},
  interhash = {11d454fa745671266a22959c1d54d953},
  intrahash = {800ca9011b57cee6230e8b9854a619f6},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  number = {5-6},
  pages = {845-848},
  timestamp = {2016-01-30T11:36:07.000+0100},
  title = {Structure of the oxide damage under progressive breakdown.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PalumboCLPTT05},
  volume = 45,
  year = 2005
}

{"_id":"wfearszcZwgRJhP9f","bibbaseid":"palumbo-condorelli-lombardo-pey-tung-tang-structureoftheoxidedamageunderprogressivebreakdown-2005","downloads":0,"creationDate":"2016-02-09T22:41:37.064Z","title":"Structure of the oxide damage under progressive breakdown.","author_short":["Palumbo, F.","Condorelli, G.","Lombardo, S.","Pey, K. L.","Tung, C. H.","Tang, L. J."],"year":2005,"bibtype":"article","biburl":"http://www.bibsonomy.org/bib/author/pablo j gonzalez?items=1000","bibdata":{"bibtype":"article","type":"article","added-at":"2016-01-29T00:00:00.000+0100","author":[{"propositions":[],"lastnames":["Palumbo"],"firstnames":["Felix"],"suffixes":[]},{"propositions":[],"lastnames":["Condorelli"],"firstnames":["G."],"suffixes":[]},{"propositions":[],"lastnames":["Lombardo"],"firstnames":["Salvatore"],"suffixes":[]},{"propositions":[],"lastnames":["Pey"],"firstnames":["K.","L."],"suffixes":[]},{"propositions":[],"lastnames":["Tung"],"firstnames":["C.","H."],"suffixes":[]},{"propositions":[],"lastnames":["Tang"],"firstnames":["L.","J."],"suffixes":[]}],"biburl":"http://www.bibsonomy.org/bibtex/2800ca9011b57cee6230e8b9854a619f6/dblp","ee":"http://dx.doi.org/10.1016/j.microrel.2004.11.034","interhash":"11d454fa745671266a22959c1d54d953","intrahash":"800ca9011b57cee6230e8b9854a619f6","journal":"Microelectronics Reliability","keywords":"dblp","number":"5-6","pages":"845-848","timestamp":"2016-01-30T11:36:07.000+0100","title":"Structure of the oxide damage under progressive breakdown.","url":"http://dblp.uni-trier.de/db/journals/mr/mr45.html#PalumboCLPTT05","volume":"45","year":"2005","bibtex":"@article{journals/mr/PalumboCLPTT05,\n added-at = {2016-01-29T00:00:00.000+0100},\n author = {Palumbo, Felix and Condorelli, G. and Lombardo, Salvatore and Pey, K. L. and Tung, C. H. and Tang, L. J.},\n biburl = {http://www.bibsonomy.org/bibtex/2800ca9011b57cee6230e8b9854a619f6/dblp},\n ee = {http://dx.doi.org/10.1016/j.microrel.2004.11.034},\n interhash = {11d454fa745671266a22959c1d54d953},\n intrahash = {800ca9011b57cee6230e8b9854a619f6},\n journal = {Microelectronics Reliability},\n keywords = {dblp},\n number = {5-6},\n pages = {845-848},\n timestamp = {2016-01-30T11:36:07.000+0100},\n title = {Structure of the oxide damage under progressive breakdown.},\n url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PalumboCLPTT05},\n volume = 45,\n year = 2005\n}\n\n","author_short":["Palumbo, F.","Condorelli, G.","Lombardo, S.","Pey, K. L.","Tung, C. H.","Tang, L. J."],"key":"journals/mr/PalumboCLPTT05","id":"journals/mr/PalumboCLPTT05","bibbaseid":"palumbo-condorelli-lombardo-pey-tung-tang-structureoftheoxidedamageunderprogressivebreakdown-2005","role":"author","urls":{"Link":"http://dx.doi.org/10.1016/j.microrel.2004.11.034","Paper":"http://dblp.uni-trier.de/db/journals/mr/mr45.html#PalumboCLPTT05"},"keyword":["dblp"],"downloads":0},"search_terms":["structure","oxide","damage","under","progressive","breakdown","palumbo","condorelli","lombardo","pey","tung","tang"],"keywords":["dblp"],"authorIDs":[],"dataSources":["Lao6JF73XpBJmfaxa"]}