Structure of the oxide damage under progressive breakdown. Palumbo, F., Condorelli, G., Lombardo, S., Pey, K. L., Tung, C. H., & Tang, L. J. Microelectronics Reliability, 45(5-6):845-848, 2005. Link Paper bibtex @article{journals/mr/PalumboCLPTT05,
added-at = {2016-01-29T00:00:00.000+0100},
author = {Palumbo, Felix and Condorelli, G. and Lombardo, Salvatore and Pey, K. L. and Tung, C. H. and Tang, L. J.},
biburl = {http://www.bibsonomy.org/bibtex/2800ca9011b57cee6230e8b9854a619f6/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2004.11.034},
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journal = {Microelectronics Reliability},
keywords = {dblp},
number = {5-6},
pages = {845-848},
timestamp = {2016-01-30T11:36:07.000+0100},
title = {Structure of the oxide damage under progressive breakdown.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PalumboCLPTT05},
volume = 45,
year = 2005
}
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