Electrical spectral technique for measuring cross-phase modulation impact in WDM optical systems. Paradiso, L., Boffi, P., Marazzi, L., Pozzi, G., Artiglia, M., & Martinelli, M. IEEE Photonics Technology Letters, 17(1):160-162, 1, 2005. Website doi abstract bibtex An electrical spectral technique to correctly evaluate cross-phase modulation behavior in intensity modulation-direct detection systems is proposed. Intrinsic advantages of the technique, in terms of high accuracy, are discussed in comparison with the classical time-domain method, which requires precise receiver noise characterization. Measures have been performed with a pump-and-probe scheme on different standard optical communications fibers (i.e., G.652, G.655). The employed pump has been intensity modulated by a nonreturn-to-zero alternate pattern at different bit rates (from 1 to 10 Gb/s), with 0.8- and 1.6-nm pump-probe wavelength spacing. The experimental results are compared with the time-domain technique when accurate calibration is performed.
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title = {Electrical spectral technique for measuring cross-phase modulation impact in WDM optical systems},
type = {article},
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abstract = {An electrical spectral technique to correctly evaluate cross-phase modulation behavior in intensity modulation-direct detection systems is proposed. Intrinsic advantages of the technique, in terms of high accuracy, are discussed in comparison with the classical time-domain method, which requires precise receiver noise characterization. Measures have been performed with a pump-and-probe scheme on different standard optical communications fibers (i.e., G.652, G.655). The employed pump has been intensity modulated by a nonreturn-to-zero alternate pattern at different bit rates (from 1 to 10 Gb/s), with 0.8- and 1.6-nm pump-probe wavelength spacing. The experimental results are compared with the time-domain technique when accurate calibration is performed.},
bibtype = {article},
author = {Paradiso, Livio and Boffi, Pierpaolo and Marazzi, Lucia and Pozzi, Giandomenico and Artiglia, Massimo and Martinelli, Mario},
doi = {10.1109/LPT.2004.837747},
journal = {IEEE Photonics Technology Letters},
number = {1}
}
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