DFT for Low Cost SOC Test. Parekhji, R. A. In Asian Test Symposium, pages 451, 2005. IEEE Computer Society. ![DFT for Low Cost SOC Test. [link]](https://bibbase.org/img/filetypes/link.svg "link")
Link Paper bibtex @inproceedings{conf/ats/Parekhji05,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Parekhji, Rubin A.},
biburl = {https://www.bibsonomy.org/bibtex/252b1776ec1f554dd57af9b2cf7d92fcf/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2005},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.51},
interhash = {fbacc6587ce3a2ada745a518126c19b9},
intrahash = {52b1776ec1f554dd57af9b2cf7d92fcf},
isbn = {0-7695-2481-8},
keywords = {dblp},
pages = 451,
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:36:05.000+0200},
title = {DFT for Low Cost SOC Test.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05},
year = 2005
}
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{"_id":"w2L2NAzvrYk4ajH6Y","bibbaseid":"parekhji-dftforlowcostsoctest-2005","author_short":["Parekhji, R. A."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","added-at":"2023-03-24T00:00:00.000+0100","author":[{"propositions":[],"lastnames":["Parekhji"],"firstnames":["Rubin","A."],"suffixes":[]}],"biburl":"https://www.bibsonomy.org/bibtex/252b1776ec1f554dd57af9b2cf7d92fcf/dblp","booktitle":"Asian Test Symposium","crossref":"conf/ats/2005","ee":"https://doi.ieeecomputersociety.org/10.1109/ATS.2005.51","interhash":"fbacc6587ce3a2ada745a518126c19b9","intrahash":"52b1776ec1f554dd57af9b2cf7d92fcf","isbn":"0-7695-2481-8","keywords":"dblp","pages":"451","publisher":"IEEE Computer Society","timestamp":"2024-04-10T06:36:05.000+0200","title":"DFT for Low Cost SOC Test.","url":"http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05","year":"2005","bibtex":"@inproceedings{conf/ats/Parekhji05,\n added-at = {2023-03-24T00:00:00.000+0100},\n author = {Parekhji, Rubin A.},\n biburl = {https://www.bibsonomy.org/bibtex/252b1776ec1f554dd57af9b2cf7d92fcf/dblp},\n booktitle = {Asian Test Symposium},\n crossref = {conf/ats/2005},\n ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.51},\n interhash = {fbacc6587ce3a2ada745a518126c19b9},\n intrahash = {52b1776ec1f554dd57af9b2cf7d92fcf},\n isbn = {0-7695-2481-8},\n keywords = {dblp},\n pages = 451,\n publisher = {IEEE Computer Society},\n timestamp = {2024-04-10T06:36:05.000+0200},\n title = {DFT for Low Cost SOC Test.},\n url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05},\n year = 2005\n}\n\n","author_short":["Parekhji, R. A."],"key":"conf/ats/Parekhji05","id":"conf/ats/Parekhji05","bibbaseid":"parekhji-dftforlowcostsoctest-2005","role":"author","urls":{"Link":"https://doi.ieeecomputersociety.org/10.1109/ATS.2005.51","Paper":"http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05"},"keyword":["dblp"],"metadata":{"authorlinks":{}},"downloads":0,"html":""},"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/Rubin?items=1000","dataSources":["74JLffDBQLjrojguT"],"keywords":["dblp"],"search_terms":["dft","low","cost","soc","test","parekhji"],"title":"DFT for Low Cost SOC Test.","year":2005}