Trace inference, curvature consistency, and curve detection. Parent, P. & Zucker, S., W. Pattern Analysis and Machine Intelligence, IEEE Transactions on, 11(8):823-839, 8, 1989.
bibtex   
@article{
 title = {Trace inference, curvature consistency, and curve detection},
 type = {article},
 year = {1989},
 identifiers = {[object Object]},
 keywords = {inference mechanisms;pattern recognition;picture p},
 pages = {823-839},
 volume = {11},
 month = {8},
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 created = {2015-03-20T23:35:48.000Z},
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 last_modified = {2015-03-20T23:35:48.000Z},
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 citation_key = {Parent:1989kc},
 source_type = {article},
 bibtype = {article},
 author = {Parent, P and Zucker, S W},
 journal = {Pattern Analysis and Machine Intelligence, IEEE Transactions on},
 number = {8}
}

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