Electronic structure of epitaxial (Sr,Ca)RuO3 films studied by photoemission and x-ray absorption spectroscopy. Park, J, Oh, S., Park, J., Kim, D., & Eom, C. PHYSICAL REVIEW B, FEB, 2004.
doi  abstract   bibtex   
Electronic structures of epitaxial (Sr,Ca)RuO3 thin films are studied by photoemission and x-ray absorption spectroscopy using synchrotron radiation. The Ru 4d spectral weights obtained by utilizing the Cooper minimum phenomena of photoionization cross-section reveal a strong mixing between Ru 4d and O 2p states as well as the signature of electron correlation effect near the Fermi level in both SrRuO3 and CaRuO3. However the electron correlation effect seems more important in CaRuO3 than SrRuO3. The detailed shapes of the valence band are found to depend on the sample cleaning methods, where the single-crystalline films cleaned by in situ annealing show more enhanced structures in the spectra than the scraped polycrystalline samples.
@article{ ISI:000220185100025,
Author = {Park, J and Oh, SJ and Park, JH and Kim, DM and Eom, CB},
Title = {{Electronic structure of epitaxial (Sr,Ca)RuO3 films studied by
   photoemission and x-ray absorption spectroscopy}},
Journal = {{PHYSICAL REVIEW B}},
Year = {{2004}},
Volume = {{69}},
Number = {{8}},
Month = {{FEB}},
Abstract = {{Electronic structures of epitaxial (Sr,Ca)RuO3 thin films are studied by
   photoemission and x-ray absorption spectroscopy using synchrotron
   radiation. The Ru 4d spectral weights obtained by utilizing the Cooper
   minimum phenomena of photoionization cross-section reveal a strong
   mixing between Ru 4d and O 2p states as well as the signature of
   electron correlation effect near the Fermi level in both SrRuO3 and
   CaRuO3. However the electron correlation effect seems more important in
   CaRuO3 than SrRuO3. The detailed shapes of the valence band are found to
   depend on the sample cleaning methods, where the single-crystalline
   films cleaned by in situ annealing show more enhanced structures in the
   spectra than the scraped polycrystalline samples.}},
DOI = {{10.1103/PhysRevB.69.085108}},
Article-Number = {{085108}},
ISSN = {{2469-9950}},
EISSN = {{2469-9969}},
ResearcherID-Numbers = {{Eom, Chang-Beom/I-5567-2014}},
Unique-ID = {{ISI:000220185100025}},
}

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