A unified approach of multi-scale deep and hand-crafted features for defocus estimation. Park, J., Tai, Y., Cho, D., & So Kweon, I. In Proceedings of the IEEE conference on computer vision and pattern recognition, pages 1736–1745, 2017.
bibtex   
@inproceedings{park2017unified,
  title={A unified approach of multi-scale deep and hand-crafted features for defocus estimation},
  author={Park, Jinsun and Tai, Yu-Wing and Cho, Donghyeon and So Kweon, In},
  booktitle={Proceedings of the IEEE conference on computer vision and pattern recognition},
  pages={1736--1745},
  year={2017}
}

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