A unified approach of multi-scale deep and hand-crafted features for defocus estimation. Park, J., Tai, Y., Cho, D., & So Kweon, I. In Proceedings of the IEEE conference on computer vision and pattern recognition, pages 1736–1745, 2017. bibtex @inproceedings{park2017unified,
title={A unified approach of multi-scale deep and hand-crafted features for defocus estimation},
author={Park, Jinsun and Tai, Yu-Wing and Cho, Donghyeon and So Kweon, In},
booktitle={Proceedings of the IEEE conference on computer vision and pattern recognition},
pages={1736--1745},
year={2017}
}
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