Advances in Artefact Quality Analysis for Safety-Critical Systems. Parra, E., Alonso, L., Mendieta, R., & de la Vara, J. L. In Wolter, K., Schieferdecker, I., Gallina, B., Cukier, M., Natella, R., Ivaki, N. R., & Laranjeiro, N., editors, IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops 2019, Berlin, Germany, October 27-30, 2019, pages 79–84, 2019. IEEE. Paper doi bibtex @inproceedings{DBLP:conf/issre/ParraAMV19,
author = {Eugenio Parra and
Luis Alonso and
Roy Mendieta and
Jose Luis de la Vara},
editor = {Katinka Wolter and
Ina Schieferdecker and
Barbara Gallina and
Michel Cukier and
Roberto Natella and
Naghmeh Ramezani Ivaki and
Nuno Laranjeiro},
title = {Advances in Artefact Quality Analysis for Safety-Critical Systems},
booktitle = {{IEEE} International Symposium on Software Reliability Engineering
Workshops, {ISSRE} Workshops 2019, Berlin, Germany, October 27-30,
2019},
pages = {79--84},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ISSREW.2019.00047},
doi = {10.1109/ISSREW.2019.00047},
timestamp = {Mon, 28 Dec 2020 11:31:03 +0100},
biburl = {https://dblp.org/rec/conf/issre/ParraAMV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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