@inproceedings{DBLP:conf/issre/ParraAMV19,
  author    = {Eugenio Parra and
               Luis Alonso and
               Roy Mendieta and
               Jose Luis de la Vara},
  editor    = {Katinka Wolter and
               Ina Schieferdecker and
               Barbara Gallina and
               Michel Cukier and
               Roberto Natella and
               Naghmeh Ramezani Ivaki and
               Nuno Laranjeiro},
  title     = {Advances in Artefact Quality Analysis for Safety-Critical Systems},
  booktitle = {{IEEE} International Symposium on Software Reliability Engineering
               Workshops, {ISSRE} Workshops 2019, Berlin, Germany, October 27-30,
               2019},
  pages     = {79--84},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/ISSREW.2019.00047},
  doi       = {10.1109/ISSREW.2019.00047},
  timestamp = {Mon, 28 Dec 2020 11:31:03 +0100},
  biburl    = {https://dblp.org/rec/conf/issre/ParraAMV19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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