Risk-Efficient Sequential Simulation Estimators. Pasupathy, R. & Yeh, Y. In Bae, K., Feng, B., Kim, S., Lazarova-Molnar, S., Zheng, Z., Roeder, T., & Thiesing, R., editors, Proceedings of the 2020 Winter Simulation Conference, Piscataway, NJ. Institute of Electrical and Electronics Engineers, Inc..
bibtex   
@inproceedings{2020pasyehWSC,
  author = {R. Pasupathy and Y. Yeh},
  title = {Risk-Efficient Sequential Simulation Estimators},
  booktitle = {Proceedings of the 2020 Winter Simulation Conference},
  editor = {K.-H. Bae and B. Feng and S. Kim and S. Lazarova-Molnar and Z. Zheng and T. Roeder and R. Thiesing},
  publisher = {Institute of Electrical and Electronics Engineers, Inc.},
  address = {Piscataway, NJ},
  pages = {}
}

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