@article{664,
  author = {Harsh Patel and Abhishek Roy and Farah B. Yahya and Ningxi Liu and Benton H. Calhoun and Ayako Harada and Kazuyuki Kumeno and Makoto Yasuda and T. Ema},
  title = {A 55nm Ultra Low Leakage Deeply Depleted Channel Technology Optimized for Energy Minimization in Subthreshold SRAM and Logic},
  year = {2017},
  journal = {IEICE Technical Report; IEICE Tech. Rep.},
  url = {https://www.ieice.org/ken/paper/20170421pbsr/eng/}
}

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