{"_id":"7pJvr95r64JizdeMu","bibbaseid":"peng-kuo-chiang-ku-chang-experimentalcharacterizationandmechanicalbehavioranalysisofintermetalliccompoundsofsn35agleadfreesolderbumpwithticuniubmoncopperchip-2006","author_short":["Peng, C.","Kuo, C.","Chiang, K.","Ku, T.","Chang, K."],"bibdata":{"bibtype":"article","type":"article","added-at":"2020-02-22T00:00:00.000+0100","author":[{"propositions":[],"lastnames":["Peng"],"firstnames":["Chih-Tang"],"suffixes":[]},{"propositions":[],"lastnames":["Kuo"],"firstnames":["Chia-Tai"],"suffixes":[]},{"propositions":[],"lastnames":["Chiang"],"firstnames":["Kuo-Ning"],"suffixes":[]},{"propositions":[],"lastnames":["Ku"],"firstnames":["Terry"],"suffixes":[]},{"propositions":[],"lastnames":["Chang"],"firstnames":["Kenny"],"suffixes":[]}],"biburl":"https://www.bibsonomy.org/bibtex/21852fbb2ed933828c8cc32a469ff82a1/dblp","ee":"https://doi.org/10.1016/j.microrel.2005.06.010","interhash":"9be817f4320927dbc17494806ba55a60","intrahash":"1852fbb2ed933828c8cc32a469ff82a1","journal":"Microelectron. Reliab.","keywords":"dblp","number":"2-4","pages":"523-534","timestamp":"2020-02-25T13:28:39.000+0100","title":"Experimental characterization and mechanical behavior analysis of intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni UBM on copper chip.","url":"http://dblp.uni-trier.de/db/journals/mr/mr46.html#PengKCKC06","volume":"46","year":"2006","bibtex":"@article{journals/mr/PengKCKC06,\n added-at = {2020-02-22T00:00:00.000+0100},\n author = {Peng, Chih-Tang and Kuo, Chia-Tai and Chiang, Kuo-Ning and Ku, Terry and Chang, Kenny},\n biburl = {https://www.bibsonomy.org/bibtex/21852fbb2ed933828c8cc32a469ff82a1/dblp},\n ee = {https://doi.org/10.1016/j.microrel.2005.06.010},\n interhash = {9be817f4320927dbc17494806ba55a60},\n intrahash = {1852fbb2ed933828c8cc32a469ff82a1},\n journal = {Microelectron. Reliab.},\n keywords = {dblp},\n number = {2-4},\n pages = {523-534},\n timestamp = {2020-02-25T13:28:39.000+0100},\n title = {Experimental characterization and mechanical behavior analysis of intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni UBM on copper chip.},\n url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#PengKCKC06},\n volume = 46,\n year = 2006\n}\n\n","author_short":["Peng, C.","Kuo, C.","Chiang, K.","Ku, T.","Chang, K."],"key":"journals/mr/PengKCKC06","id":"journals/mr/PengKCKC06","bibbaseid":"peng-kuo-chiang-ku-chang-experimentalcharacterizationandmechanicalbehavioranalysisofintermetalliccompoundsofsn35agleadfreesolderbumpwithticuniubmoncopperchip-2006","role":"author","urls":{"Link":"https://doi.org/10.1016/j.microrel.2005.06.010","Paper":"http://dblp.uni-trier.de/db/journals/mr/mr46.html#PengKCKC06"},"keyword":["dblp"],"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"http://www.bibsonomy.org/bib/author/Kenny?items=1000","dataSources":["qRWyJpuJ4HEEJs5Rq"],"keywords":["dblp"],"search_terms":["experimental","characterization","mechanical","behavior","analysis","intermetallic","compounds","5ag","lead","free","solder","bump","ubm","copper","chip","peng","kuo","chiang","ku","chang"],"title":"Experimental characterization and mechanical behavior analysis of intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni UBM on copper chip.","year":2006}